The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems.
目 錄
Preface.
1. Electromagnetic Properties of Materials.
2. Microwave Theory and Techniques for Materials Characterization.
3. Reflection Methods.
4. Transmission/Reflection Methods.
5. Resonator Methods.
6. Resonant-perturbation Methods.
7. Planar-circuit Methods.
8. Measurements of Permittivity and Permeability Tensors.
9. Measurement of Ferroelectric Materials.
10. Microwave Measurement of Chiral Materials.
11. Measurement of Microwave Electrical Transport Properties.
12. Measurement of Dieletric Properties of Materials at High Temperatures.
Index.
