The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
此叢書 Routledge Studies in Social and Political Thought 書目
Adam Smith"s Political Philosophy: The Invisible Hand and Spontaneous Order
Tocqueville"s Political and Moral Thought: New Liberalism
An Actor"s Handbook: An Alphabetical Arrangement of Concise Statements on Aspects of Acting, Reissue of first edition
Hayek"s Liberalism and Its Origins: His Idea of Spontaneous Order and the Scottish Enlightenment
Durkheim"s Suicide: A Century of Research and Debate
Conservation Tillage in U.S. Agriculture: Environmental, Economic, and Policy Issues
City A-Z: Urban Fragments
City A-Z: Urban Fragments
Parkinson"s Disease and Quality of Life
International Who"s Who in Music
Parkinson"s Disease and Quality of Life
Wittgenstein"s Investigations 1-133: A Guide and Interpretation
On Durkheim"s Elementary Forms of Religious Life
The Business of Children"s Entertainment
Assessing Reading 1: Theory and Practice
Wednesday"s Child: Research into Women"s Experience of Neglect and Abuse in Childhood and Adult Depression
Wednesday"s Child: Research into Women"s Experience of Neglect and Abuse in Childhood and Adult Depression
High Resolution X-Ray Diffractometry And Topography
