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好吃(NO.5+6)套書(共二冊)
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二樓書籍分類
 
High Resolution X-Ray Diffractometry And Topography


沒有庫存
訂購需時10-14天
9780850667585
D.K. Bowen Brian K Tanner 
CRC Press
1998年2月05日
382.00  元
HK$ 362.9  









[ 尚未分類 ]









The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.




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