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DIGITAL COMMUNICATIONS TEST AND MEASUREMENT: HIGH-SPEED PHYSICAL LAYER CHARACTERZATION
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9780132209106 | |
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DERICKSON | |
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全華科技 | |
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2008年1月01日
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527.00 元
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HK$ 500.65
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詳
細
資
料
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* 叢書系列：實用電子
* 規格：平裝 / 976頁 / 普級 / 單色印刷 / 初版
* 出版地：台灣
實用電子
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推
薦
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內
容
簡
介
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Today’s new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works.Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout.Coverage includesSignal integrity from a measurement point of viewDigital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopesBit error ratio measurements for both electrical and optical linksExtensive coverage on the topic of jitter in high-speed networksState-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signalsReceiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testingChannel and system characterization: TDR/T and frequency domain-based alternativesTesting and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM
本書特色
The first single source of information on the vital topic of digital communication test and measurement, from the top experts in the field
1 . As digital communications systems move to higher and higher speeds, engineers are faced with challenges not just in design but also in testing and measuring those systems
2 . The editors have gathered articles from the top researchers and practitioners in the field
3 . The main areas of coverage are waveform analysis, bit error ratio measurements, and jitter analysis of high-speed design
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目
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Preface xxi
About the Authors xxvii
Acknowledgments xxxiii
Chapter 1 Fundamentals of Digital Communications Systems 1
Chapter 2 Jitter Basics 29
Chapter 3 Serial Communication Systems and Modulation Codes 61
Chapter 4 Bit Error Ratio Testing 169
Chapter 5 BERT Scan Measurements 195
Chapter 6 Waveform Analysis--Real-Time Scopes 243
Chapter 7 Characterizing High-Speed Digital Communications Signals and Systems with the Equivalent-Time Sampling Oscilloscope 329
Chapter 8 High-Speed Waveform Analysis Using All-Optical Sampling 421
Chapter 9 Clock Synthesis, Phase Locked Loops, and Clock Recovery 505
Chapter 10 Jitter Tolerance Testing 533
Chapter 11 Sensitivity Testing in Optical Digital Communications 563
Chapter 12 Stress Tests in High-Speed Serial Links 605
Chapter 13 Measurements on Interconnects 657
Chapter 14 Frequency Domain Measurements 713
Chapter 15 Jitter and Signaling Testing for Chip-to-Chip Link Components and Systems 785
Appendix A Pseudo-Random Binary Sequences 819
Appendix B Passive Elements for Test Setups 835
Appendix C Coaxial Cables and Connectors 847
Appendix D Supplemental Materials for Chapter 3 861
Index 911
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